A Comprehensive Review of Surface Defect Detection in Manufacturing Using Convolutional Neural Networks

Authors

  • Sanjeev Kumar, Dr. Vineet Agarwal

Keywords:

Surface defect detection, Convolutional Neural Networks, Deep learning, Industrial inspection, Machine vision.

Abstract

Surface defect detection is a critical component of quality assurance in modern manufacturing, directly influencing product reliability and operational efficiency. With the rise of Industry 4.0, traditional inspection methods have been increasingly replaced by intelligent vision-based systems powered by Convolutional Neural Networks (CNNs). This paper presents a comprehensive review of CNN-based approaches for detecting surface defects across various manufacturing domains, including metal, textile, and electronics industries. It examines key architectures, detection strategies such as classification, object detection, and segmentation, and widely used industrial datasets. The review also highlights recent advancements, including transfer learning, attention mechanisms, and hybrid CNN-Transformer models, which enhance detection accuracy and robustness. Furthermore, it discusses major challenges such as data imbalance, small defect detection, and real-time deployment constraints, while outlining future research directions for scalable and explainable solutions.

References

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How to Cite

Sanjeev Kumar, Dr. Vineet Agarwal. (2026). A Comprehensive Review of Surface Defect Detection in Manufacturing Using Convolutional Neural Networks. International Journal of Engineering Science & Humanities, 16(2), 430–440. Retrieved from https://www.ijesh.com/j/article/view/839

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Section

Original Research Articles

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